Direct Observation of Crack Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy |
| |
| Authors: | Yoshio Bando Setsuro Ito Minoru Tomozawa |
| |
| Affiliation: | National Institute for Research in Inorganic Materials, I-Namiki, Sakura-mura, Niihari-gun, Ibaraki 305, Japan;Institute for Chemical Research, Kyoto University, Uji, Kyoto 611, Japan;Materials Engineering Department, Rensselaer Polytechnic Institute, Troy, New York 12181 |
| |
| Abstract: | Crack tips in thin SiO2 glass films were observed directly by high-resolution/high-voltage electron microscopy. An elliptical crack with radius of curvature ∼ 1.5 nm was observed. When the glass film with the crack was soaked in water at 90°C for 7 d, the crack tip became blunt by a process of dissolution and precipitation. |
| |
| Keywords: | |
|
|
