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表面注入D-RESURF器件耐压模型
引用本文:李琦,王卫东,张杨,张法碧.表面注入D-RESURF器件耐压模型[J].半导体技术,2011,36(5):348-351.
作者姓名:李琦  王卫东  张杨  张法碧
作者单位:桂林电子科技大学信息与通信学院,广西,桂林,541004;桂林电子科技大学信息与通信学院,广西,桂林,541004;桂林电子科技大学信息与通信学院,广西,桂林,541004;桂林电子科技大学信息与通信学院,广西,桂林,541004
基金项目:广西自然科学基金,广西千亿元产业重大科技攻关工程项目,桂林电子科技大学博士科研启动基金
摘    要:建立表面注入双重降低表面电场(D-RESURF)结构击穿电压模型。D-RESURF器件在衬底纵向电场和Pb区附加电场的影响下,漂移区电荷共享效应增强,优化漂移区掺杂浓度增大,器件导通电阻降低。分析漂移区浓度和厚度对击穿电压的影响,获得改善击穿电压和导通电阻折中关系的途径。在满足最优表面电场和完全耗尽条件下,导出吻合较好的二维RESURF判据。在理论的指导下,成功研制出900 V的D-RESURF高压器件。

关 键 词:表面注入  双重降低表面电场  模型  击穿电压  导通电阻

Breakdown Voltage Model for D-RESURF Devices with Surface Implantation
Li Qi,Wang Weidong,Zhang Yang,Zhang Fabi.Breakdown Voltage Model for D-RESURF Devices with Surface Implantation[J].Semiconductor Technology,2011,36(5):348-351.
Authors:Li Qi  Wang Weidong  Zhang Yang  Zhang Fabi
Affiliation:(School of Information and Communication Engineering,Guilin University of Electronic Technology,Guilin 541004,China)
Abstract:An analytical model for the breakdown voltage of double RESURF(D-RESURF) devices with a surface implanted P-top region was presented.The optimal doping concentration in drift region was increased and the on-resistance was decreased by electric field modulation of the Pb region.The dependence of breakdown voltage on structure parameters of the device was calculated.An effective way to improve the trade-off between the breakdown voltage and on-resistance was also proposed.A 2-D RESURF condition was obtained and all analytical results were well verified by simulation results and previous experimental data,showing the validity of the model presented here.A 900 V double RESURF device was produced under the guide of the proposed model.
Keywords:surface implantation  double RESURF(D-RESURF)  model  breakdown voltage  on-resistance
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