High-sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: Results on aluminum and copper |
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Authors: | A. Sparavigna G. Giachello M. Omini A. Strigazzi |
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Affiliation: | (1) Dipartimento di Fisica and I.N.F.M., Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy |
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Abstract: | Thermal diffusivity and thermal expansion in high-conducting solids can be measured by means of a capacitance method, which turns out to be simple, reliable, and accurate and yields the first property with an accuracy of 1% and the second one with an accuracy of 2%. Preliminary results, which are consistent with the literature, have been obtained on pure aluminum (99.999%) and on commercial copper, both at near room temperature. |
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Keywords: | capacitance method thermal diffusivity thermal expansion |
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