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High-sensitivity capacitance method for measuring thermal diffusivity and thermal expansion: Results on aluminum and copper
Authors:A. Sparavigna  G. Giachello  M. Omini  A. Strigazzi
Affiliation:(1) Dipartimento di Fisica and I.N.F.M., Politecnico di Torino, Corso Duca degli Abruzzi 24, 10129 Torino, Italy
Abstract:Thermal diffusivity and thermal expansion in high-conducting solids can be measured by means of a capacitance method, which turns out to be simple, reliable, and accurate and yields the first property with an accuracy of sim1% and the second one with an accuracy of sim2%. Preliminary results, which are consistent with the literature, have been obtained on pure aluminum (99.999%) and on commercial copper, both at near room temperature.
Keywords:capacitance method  thermal diffusivity  thermal expansion
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