Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility

This paper is focused on the electromagnetic compatibility (EMC) of integrated circuits. The introduction gives general keyword definitions and principles for emission and susceptibility. The second part deals with the evolution of integrated circuit design and technology with its consequences on EMC. The third part describes the mechanisms for generating parasitic noise within integrated circuits and the role of the package and on-chip supply network. Next, the standardized measurement methods are described for both parasitic emission characterization (conducted and radiated) and immunity from 1 MHz to 1 GHz. Issues and proposals up to 18 GHz are discussed. The advances in modeling of emission are also addressed, as well as the issues in immunity prediction.