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Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked Loops with Faults Using VHDL-AMS |
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| Authors: | Nihal J. Godambe C.-J. Richard Shi |
| Affiliation: | (1) Wireless Integrated Technology Center, Motorola, Ft. Lauderdale, FL, 33322;(2) Department of Electrical Engineering, University of Washington, Seattle, WA, 98195 |
| Abstract: | |
| Keywords: | analog test fault modeling fault simulation noise jitter behavioral fault modeling |
| 本文献已被 SpringerLink 等数据库收录！ | |