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Ferromagnetism in ZnTe:Cr film grown on Si(1 0 0) |
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| Authors: | D Soundararajan P Peranantham D Mangalaraj D NatarajL Dorosinskii J Santoyo-SalazarJM Ko |
| Affiliation: | a Thin Films and Nanomaterials Laboratory, Department of Physics, Bharathiar University, Coimbatore 641 046, India b Department of Nanoscience and Technology, Bharathiar University, Coimbatore 641 046, India c Laboratoire “EnVironnement et Minéralurgie” UMR 7569 CNRS, INPL-ENSG, B.P. 40, 54501 VandoeuVre-lés-Nancy, France d National Institute of Metrology (TUBITAK-UME), P.K. 54, 41470 Gebze-Kocaeli, Turkey e Centro de Investigación y de Estudios Avanzados de Instituto Politécnico Nacional, Departamento de Física, Av. IPN 2508, San Pedro Zacatenco, C.P. 07360, A.P. 14-740, 07000 México, D.F., Mexico f Division of Applied Chemistry and Biotechnology, Hanbat National University, San 16-1, Dukmyung, Yusong, Daejon 305-719, South Korea |
| Abstract: | Zn1−xCrxTe (x = 0.0 and 0.05) films were grown on Si(1 0 0) substrate by using thermal evaporation method. The structure of the films was investigated by X-ray diffraction and it showed the formation of ZnCrTe phase with an amorphous background, which indicated poor crystallinity. Composition analysis by XPS disclosed the presence of antiferromagnetic Cr2O3 and Cr precipitates. Magnetic domains were observed by using magnetic force microscopy at ambient temperature and the result showed anisotropic domains with an average size of 3.5 nm. Magnetic field dependence of magnetic moment measurements showed obvious hysteresis loop with a coercive field of 121 Oe at 300 K. Temperature dependence of magnetic moment showed short-range ferromagnetic order. The Curie temperature was estimated to be 354.5 K. |
| Keywords: | ZnTe:Cr film Magnetic domains M-H curve M-T measurements |
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