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Effects of crystallization temperature on the stress of NiTi thin films |
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| Authors: | H.-J. Lee X. Huang K.P. Mohanchandra G. Carman A.G. Ramirez |
| Affiliation: | aSchool of Advanced Materials Science and Engineering, Sungkyunkwan University, Kyongki-Do, South Korea;bDepartment of Mechanical Engineering, Yale University, New Haven, CT 06520, USA;cMechanical & Aerospace Engineering Department, UCLA, Los Angeles, CA 90095, USA;dDepartment of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA |
| Abstract: | |
| Keywords: | Shape memory alloys Thin films Annealing Phase transformations Transmission electron microscopy (TEM) |
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