| 直方图在显微热成像微扫描位置标定中的应用 |
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| 引用本文： | 关丛荣,金伟其,王吉晖.直方图在显微热成像微扫描位置标定中的应用[J].红外与激光工程,2013,42(2):519-523. |
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| 作者姓名： | 关丛荣 金伟其 王吉晖 |
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| 作者单位： | 1.北方工业大学 机电工程学院,北京 100041; |
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| 基金项目： | 北京市自然科学基金(4062029);科技部中小型科技型企业创新基金(06KW1051) |
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| 摘 要： | 为提高显微热成像系统微扫描装置位置标定精度，提出了一种基于直方图统计拉伸显微热图像细节增强的傅里叶变换微位移检测方法。该方法针对显微热图像直方图特点，通过直方图统计拉伸改善图像对比度增强细节，以此提高基于傅里叶变换平移特性的微位移检测准确度，从而提高微扫描位置的标定精度。基于此方法进行了图像增强前后的位置标定和图像重构对比实验，实验结果表明:经直方图统计拉伸细节增强后的位置标定更精确，重构的图像质量更高，细节更丰富。
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| 关 键 词： | 直方图 显微热成像 光学微扫描 位置标定 |
| 收稿时间： | 2012-06-24 |
Application of histogram on micro-scanning position calibration of microscopic thermal imaging |
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| Guan Congrong,Jin Weiqi,Wang Jihui.Application of histogram on micro-scanning position calibration of microscopic thermal imaging[J].Infrared and Laser Engineering,2013,42(2):519-523. |
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| Authors: | Guan Congrong Jin Weiqi Wang Jihui |
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| Affiliation: | 1.College of Mechanical Electronical and Engineering,North China University of Technology,Beijing 100041,China;2.Key Laboratory of Photoelectric Imaging Technology and System,Ministry of Education of China,School of Optoelectronics,Beijing Institute of Technology,Beijing 100081,China |
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| Abstract: | To improve optical micro scanning device position calibration precision of the micro thermal imaging system, a Fourier transform micro displacement detection method based on histogram statistical tension was proposed. It can improve image contrast and enhance image details according to histogram features of micro thermal imaging. And with the images enhanced by histogram statistical tension can increase displacement detection accuracy by Fourier transform. So it also can improve the scanning calibration position precision. The construct experiment of before and after images enhance were done. The experiment results show that with the method of histogram statistical tension the position calibration is more precise, the reconstructed image has higher quality and more abundant details. |
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