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Self-aligned fabrication of single crystal diamond gated field emitter array
Authors:Takatoshi Yamada  Purayath Robert Vinod  Doo-Sup Hwang  Hiromichi Yoshikawa  Shin-ichi Shikata  Naoji Fujimori
Affiliation:aDiamond Research Center, National Institute of Advanced Industrial Science and Technology, 1-1-1, Umezono, Tsukuba, Ibaraki 305-8568, Japan
Abstract:This paper describes a self-aligned fabrication process for diamond gated field emitter array (FEA). Utilizing the non-conformal coverage sputtering conditions of silicon oxide, an interesting “sphere on cone” structure is formed on diamond nano tip array, which is the key point of gate hole opening process. This structure causes shadowing at certain regions of side-wall during Ti / Au gate metal deposition. Removal of “sphere” by wet etching leads to the successful fabrication of a single crystalline diamond gated FEA. Scanning electron microscope observations reveal the fabrication of a uniform emitter array with tip radius of curvature (20 nm) and gate hole (1.4 μm). We also confirmed that no noticeable physical damage exists on tip. In field emission characteristics of the fabricated single crystal diamond gated FEA, gate voltage control of field emission current is realized.
Keywords:Field emitter array  Self-aligned process  Nano-structure  Sputtering  ICP etching  Lift-off
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