Assessment of the thermal stability of anodic alumina membranes at high temperatures |
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Authors: | L Fernndez-Romero JM Montero-Moreno E Pellicer F Peir A Cornet JR Morante M Sarret C Müller |
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Affiliation: | aEnginyeria i Materials Electrònics (EME/CEMIC/CeRMAE), Departament d’Electrònica, Facultat de Física, Universitat de Barcelona, C/ Martí i Franquès, 1, E-08028 Barcelona, Spain;bLaboratori d’Electrodeposició i Corrosió (Electrodep), Departament de Química Física, Facultat de Química, Universitat de Barcelona, C/ Martí i Franquès, 1, E-08028 Barcelona, Spain |
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Abstract: | The thermal stability of anodic alumina membranes (AAMs) annealed in air from 750 °C up to 1100 °C was investigated. AAMs were produced by single-step anodising of laminated AA1050 in 0.30 M oxalic acid medium. The barrier layer provided thermal stability to the membranes, since it avoided or minimized bending and cracking phenomena. X-ray diffraction (XRD) analyses revealed that as-synthesized AAMs were amorphous and converted to polycrystalline after heat-treating above 750 °C. However, porous and barrier layers did not re-crystallize in the same way. The porous layer mainly crystallized in the γ-Al2O3 phase within the range of 900–1100 °C, while the barrier layer was converted to the α-Al2O3 phase at 1100 °C. Different grain sizes were also estimated from Scherrer's formula. Scanning electron microscopy (SEM) images pointed out that cell wall dilation of the porous layer explained membrane cracking, which was avoided in presence of the barrier layer. |
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Keywords: | Aluminium oxide AA1050 Electrochemical techniques Annealing X-ray diffraction |
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