Effect of SHI irradiation on the morphology of SnO2 thin film prepared by reactive thermal evaporation |
| |
| Affiliation: | 1. PG and Research Department of Physics, Kongunadu Arts and Science College, Coimbatore 641 029, Tamil Nadu, India;2. Inter University Accelerator Centre, Aruna Asaf Ali Marg, New Delhi 110 067, India;1. Omsk Scientific Center, Siberian Branch of the Russian Academy of Sciences, Karl Marx Avenue 15, 644040 Omsk, Russia;2. Omsk State Technical University, Mira Avenue 11, 644050 Omsk, Russia;3. St. Petersburg State University, 198504 St. Petersburg, Russia;4. Institute of Solid State Physics, Dresden University of Technology, D-01062 Dresden, Germany;1. L. N. Gumilyov Eurasian National University, Astana, Kazakhstan;2. Institute of Nuclear Physics, Astana, Kazakhstan;3. Belarus State University, Minsk, Belarus;4. Institute of Solid State Physics, University of Latvia, Riga, Latvia;1. L.N. Gumilyov Eurasian National University, 2, Satpayev Str., Astana 010008, Kazakhstan;2. Institute of Nuclear Physics, 1, Ibragimov St., Almaty 050032, Kazakhstan;3. Lomonosov Moscow State University, Leninskie Gory, Moscow 119991, Russian Federation;1. Institute of Nuclear Physics, Ibragimov St. 1, 050032 Almaty, Kazakhstan;2. The L.N. Gumilyov Eurasian National University, Satpayev Str., 2, 010008 Astana, Kazakhstan;1. L.N. Gumilyov Eurasian National University, Munaitpassov Str. 5, 0100008 Nur-Sultan, Kazakhstan;2. Institute of Physics, University of Tartu, W. Ostwald Str. 1, 50411 Tartu, Estonia;3. Institute of Solid State Physics, University of Latvia, Kengaraga 8, Riga LV-1063, Latvia;4. GSI Helmholtzzentrum für Schwerionenforschung, Planckstr. 1, 64291 Darmstadt, Germany |
| |
| Abstract: | SnO2 thin films prepared by reactive thermal evaporation on glass substrates were subjected to 120 MeV Ag9+ ion irradiation. The surface topography progression using the swift heavy ion irradiation was studied. It shows creation of unique surface morphologies and regular structures on the surface of the SnO2 thin film at particular fluences. Field Emission Scanning electron microscopy (FE-SEM) and Atomic force microscopy (AFM) are used for investigating the effect of Ag ions at different fluences on the surface of SnO2. The morphological changes suggest that ion assisted/induced diffusion process play a significant role in the evolution of nanostructures on SnO2 surface. The roughness increases from 9.4 to 14.9 with fluence upto 1 × 1012 ions/cm2 and beyond this fluence, the roughness decreases. Ion-beam induced recrystallization at lower fluences and amorphization or disordering of crystals at higher fluences are understood based on the thermal spike model. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
