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两种硅泡沫材料耐电子束辐射性能的研究
引用本文:黄纬,傅依备,许云书,卞直上,何美英. 两种硅泡沫材料耐电子束辐射性能的研究[J]. 高分子材料科学与工程, 2002, 18(3): 102-105
作者姓名:黄纬  傅依备  许云书  卞直上  何美英
作者单位:中国工程物理研究院核物理与化学研究所,四川,绵阳,621900
基金项目:中国工程物理研究院重点基金项目
摘    要:采用傅立叶红外(FT-IR)谱仪、万能材料试验机、电子蠕变松弛试验机分析了辐照前后材料的化学结构、压缩性能和应力松弛率的变化。同时使用质谱(MS)仪确定了辐解气体产物的组分,并通过负压进系统利用气相色谱(GC)仪准确测定了气体产量。结果表明,两种硅泡沫材料经辐照后其化学结构和力学性能都发生了改变,相同条件下甲基乙烯基硅泡沫(MVSF)的力学性能受吸收剂量影响比甲基苯基乙烯基硅泡沫(MPVSF)更为显著;MVSF辐解的气体产量比MDVSF的高。综合分析结果,认为MPVSF的耐辐射性比MVSP的强,因此推荐MPVSF替代MVSF用作辐照场中的垫层材料。

关 键 词:硅泡沫材料 耐电子束辐射性能 研究 甲基乙烯基硅泡沫 甲基苯基乙烯基硅泡沫 辐解气体产物 塑料
文章编号:1000-7555(2002)03-0102-04
修稿时间:2001-05-15

STUDY ON THE RADIATION-RESISTANCE OF TWO KINDS OF SILIXANE FOAMS IRRADIATED BY ELECTRON BEAM
HUANG Wei,FU Yi bei,XU Yun shu,BIAN Zhi shang,HE Mei ying. STUDY ON THE RADIATION-RESISTANCE OF TWO KINDS OF SILIXANE FOAMS IRRADIATED BY ELECTRON BEAM[J]. Polymer Materials Science & Engineering, 2002, 18(3): 102-105
Authors:HUANG Wei  FU Yi bei  XU Yun shu  BIAN Zhi shang  HE Mei ying
Abstract:The structure of the unirradiated and irradiated samples were analyzed by FT IR. The compression property of specimens was determined by universal testing machine, and the stress relaxation ratio by electron creep relaxation tester. The gas products from irradiated samples were analyzed by MS and the gas yield was precisely determined by GC through negative pressure sampling system. The result shows that the radiation resistance of MPVSF is prior to that of MVSF.
Keywords:electron beam (EB) radiation  polymethylphenylvinyl siloxane foam (MPVSF)  polymethyl vinyl siloxane foam (MVSF)  radiation resistance  gas products from irradiated sample
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