| 一种基于IDDT测试的时延故障测试产生算法 |
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| 引用本文： | 蔡烁,邝继顺,崔昌明. 一种基于IDDT测试的时延故障测试产生算法[J]. 微处理机, 2007, 28(3): 14-17,20 |
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| 作者姓名： | 蔡烁 邝继顺 崔昌明 |
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| 作者单位： | 湖南大学计算机与通信学院,长沙,410082 |
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| 摘 要： | 瞬态电流测试(IDDT Testing)作为传统电压测试和稳态电流测试(IDDQ Testing)方法的一个补充,越来越受到研究领域和工业界的关注。针对不同的故障类型,基于瞬态电流测试的测试方法也有所不同。这里提出了一种关于时延故障的测试产生算法,该算法利用3个向量来激活时延故障。实验结果表明该测试产生算法用于检测时延故障是可行的。
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| 关 键 词： | 瞬态电流测试 时延故障 PSPICE模拟 测试产生 |
| 文章编号： | 1002-2279（2007）03-0014-04 |
| 修稿时间： | 2006-10-17 |
A Test Generation Algorithm for Delay Fault Based on IDDT Test |
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| CAI Shuo,KUANG ji-shun,CUI Chang-ming. A Test Generation Algorithm for Delay Fault Based on IDDT Test[J]. Microprocessors, 2007, 28(3): 14-17,20 |
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| Authors: | CAI Shuo KUANG ji-shun CUI Chang-ming |
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| Affiliation: | School of Computer and Communication, Hunan University, Changsha 410082, China |
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| Abstract: | Recently,IDDT testing used as a complement of the voltage testing and IDDQ testing gains more and more attention in the research and industry field.Directing at different fault models,the test methods based on IDDT testing are also different.This paper proposes a new algorithm for test generation for delay fault.The algorithm uses three patterns to activate delay fault.Experiment results prove this test generation algorithm is feasible. |
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| Keywords: | IDDT Testing Delay Fault PSPICE Simulation Test Generation |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
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