| THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF-LINEAR CIRCUITS |
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| 作者姓名： | 吴耀 童诗白 |
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| 作者单位： | Department of Automation Tsinghua University，Beijing，Department of Automation，Tsinghua University，Beijing |
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| 基金项目： | The work was supported by National Science Foundation of China. |
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| 摘 要： | In view of K-fault testability,the topological construction of a practical circuitis far from ideal.In order to improve the testability of a circuit,we may increase the numberof accessible nodes or use the multi-excitation method.Effectiveness of these methods and thefeasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitationtestability are presented.
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The effective range of k-fault diagnosis of linear circuits |
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| Yao Wu,Shi Bai Tong.THE EFFECTIVE RANGE OF K-FAULT DIAGNOSIS OF-LINEAR CIRCUITS[J].Journal of Electronics,1990,7(3):207-214. |
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| Authors: | Yao Wu Shi Bai Tong |
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| Affiliation: | (1) Department of Automation, Tsinghua University, Beijing |
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| Abstract: | In view of K-fault testability,the topological construction of a practical circuit is far from ideal.In order to improve the testability of a circuit,we may increase the number of accessible nodes or use the multi-excitation method.Effectiveness of these methods and the feasibility of choosing accessible nodes are discussed in detail.The conditions for multi-excitation testability are presented. |
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| Keywords: | Analog circuit Fault diagnosis K-fault diagnosis Testability |
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