| 5K下针尖导致Si(001)表面结构变化的NC-AFM观察 |
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| 引用本文： | 李艳君,NOMURA H,OZAKI N,NAITOH Y,KAGESHIMA M,SUGAWARA Y.5K下针尖导致Si(001)表面结构变化的NC-AFM观察[J].现代科学仪器,2006(Z1):40-41. |
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| 作者姓名： | 李艳君 NOMURA H OZAKI N NAITOH Y KAGESHIMA M SUGAWARA Y |
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| 作者单位： | 大阪大学,应用物理系,日本 |
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| 摘 要： | The Si(001)surface has attracted much attention because of its practical importance in most LSI devices t11at are fabricated on this surface.However,recent STM studies performed at low temperatures(LT)questioned whether the c(4x2)phase is the most stable phase.
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The tip-induced surface structure change on Si(001)surface by NC-AFM at 5K |
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| LI Yan-jun,NOMURA H,OZAKI N,NAITOH Y,KAGESHIMA M,SUGAWARA Y.The tip-induced surface structure change on Si(001)surface by NC-AFM at 5K[J].Modern Scientific Instruments,2006(Z1):40-41. |
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| Authors: | LI Yan-jun NOMURA H OZAKI N NAITOH Y KAGESHIMA M SUGAWARA Y |
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