Lateral Inhomogeneity in the Electronic Structure of a Conjugated Poly(3‐hexylthiophene) Thin Film |
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| Authors: | Kaname Kanai Takahiro Miyazaki Takanori Wakita Kouki Akaike Takayoshi Yokoya Yukio Ouchi Kazuhiko Seki |
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| Affiliation: | 1. Research Core for Interdisciplinary Sciences, Okayama University 3‐1‐1 Tsushima‐naka, Okayama 700‐8530 (Japan);2. Current address: Department of Physics, Faculty of Science and Technology, Tokyo University of Science, Noda, Chiba 278‐8510 (Japan);3. Department of Chemistry, Graduate School of Science, Nagoya University Furo‐cho, Chikusa‐ku, Nagoya 464‐8602 (Japan);4. Research Laboratory for Surface Science, Okayama University 3‐1‐1 Tsushima‐naka, Okayama 700‐8530 (Japan) |
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| Abstract: | How annealing influences the morphology of a highly regioregular poly(3‐hexylthiophene) (RR‐P3HT) film at the substrate interface as well as the lateral inhomogeneity in the electronic structure of the film are elucidated. Whereas previous studies have reported that high‐molecular‐weight (MW) RR‐P3HT films tend to show low crystallinity even after annealing, it is found that high‐MW RR‐P3HT does show high crystallinity after annealing at high temperature for a long time. Photoemission electron microscopy (PEEM), X‐ray photoemission spectroscopy, and ultraviolet photoemission spectroscopy results clearly resolve a considerable lateral inhomogeneity in the morphology of RR‐P3HT film, which results in a variation of the electronic structure depending on the local crystallinity. The PEEM results show how annealing facilitates crystal growth in a high‐MW RR‐P3HT film. |
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| Keywords: | conducting polymer electronic structure morphology P3HT photoemission microscope |
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