首页 | 本学科首页   官方微博 | 高级检索  
     

半导体激光器端面剩余模式反射率测量结果的分析
引用本文:武岚,罗斌,陈建国,卢玉村. 半导体激光器端面剩余模式反射率测量结果的分析[J]. 中国激光, 1993, 20(5): 349-353
作者姓名:武岚  罗斌  陈建国  卢玉村
作者单位:四川大学光电科学系,四川大学光电科学系,四川大学光电科学系,四川大学光电科学系 成都 610064,成都 610064,成都 610064,成都 610064
基金项目:国家教委博士点基金,国家自然科学基金资助项目
摘    要:本文分析了单色仪出射狭缝宽度对半导体激光器镀膜端面反射率测量的影响,理论预言了调制度和反射率的测量值以及测量谱中波峰和波谷的位置随缝宽周期性变化的规律。实验结果证实了理论预测的正确性。

关 键 词:半导体激光器  光栅单色仪  调制度  端面剩余模式反射率
收稿时间:1992-01-29

Analysis of measurement results of residual reflectivity at AR coated facets of semiconductor lasers
Wu Lan,Luo Bin,Chen Jianguo,Lu Yuchun. Analysis of measurement results of residual reflectivity at AR coated facets of semiconductor lasers[J]. Chinese Journal of Lasers, 1993, 20(5): 349-353
Authors:Wu Lan  Luo Bin  Chen Jianguo  Lu Yuchun
Abstract:Westbrook's theory has been adopted to analyse.the effects of a grating monochramator on the measurement of modal reflectivity at AR coated facets of a semiconductor laser diode. It has been verified that the measured modulation index and reflectivity changes with the exit slit width periodically. The period has been identified to correspond to the diode mode spacing. The analysis has also predicted that when the passband width of the monochramator is somewhat larger than the diode mode spacing, the measured peaks and valleys will be different from their real positions by a half of the mode spacing.
Keywords:semiconductor laser diode   grating monochramator   modulation index   normalised passband width  
本文献已被 CNKI 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号