| 表面弯曲的古陶瓷样品X射线荧光无损定量分析 |
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| 引用本文： | 何文权,熊樱菲. 表面弯曲的古陶瓷样品X射线荧光无损定量分析[J]. 核技术, 2002, 25(7): 581-586 |
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| 作者姓名： | 何文权 熊樱菲 |
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| 作者单位： | 上海博物馆文物保护与考古实验室,上海,200231 |
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| 摘 要： | 常规X荧光分析中对样品表面有较高要求，这大大影响了利用X射线荧光法对古陶瓷无损分析的进行，本文提出了基本参数法和经验系数法中的两种较为简单的处理方法，以满足对不同大小和弯曲形状品分析的需要。
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| 关 键 词： | XRF 古陶瓷 无损分析 基本参数法 |
| 修稿时间： | 2000-08-19 |
A method of non-destructive quantitative analysis of the ancient ceramics with curved surface |
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| HE Wenquan XIONG Yingfei. A method of non-destructive quantitative analysis of the ancient ceramics with curved surface[J]. Nuclear Techniques, 2002, 25(7): 581-586 |
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| Authors: | HE Wenquan XIONG Yingfei |
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| Abstract: | Generally the surface of the sample should be smooth and flat in XRF analysis, but the ancient ceramics can hardly match this condition. Two simple methods are put forward in fundamental method and emperical correction method of XRF analysis, so the analysis of little sample or the sample with curved surface can be easily completed. |
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| Keywords: | XRF Ancient ceramic Non-destructive analysis Fundamental parameter |
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