Properties of cobalt-doped zinc oxide thin films grown by pulsed laser deposition on glass substrates |
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| Affiliation: | 1. Thin Films and Interfaces Laboratory, University of Constantine 1, Constantine, Algeria;2. Welding and NDT Research Center (CSC), BP 64, Cheraga, Algeria;3. Advanced Technology Development Center (CDTA), Baba-Hassen, Algiers, Algeria;1. University of Gent, vakgroep Vaste Stof Wetenschappen;2. Hungarian Academy of Sciences;2. Slovak Academy of Sciences;4. Sultan Qaboos University;5. Istanbul Medeniyet University, Turkey;1. Department of Opticianry, Vocationel School of Medical Sciences, Turgut Ozal University, Ankara, Turkey;2. Department of Computer Engineering, Technology Faculty, Duzce University, Duzce, Turkey;3. Department of Physics, Faculty of Science, Gazi University, Ankara, Turkey;1. Department of Physics, University of Botswana, Private Bag UB0704, Gaborone, Botswana;2. Department of Physics and Astronomy, Botswana International University of Science and Technology, Private Bag 16, Palapye, Botswana;1. Palacky University, RCPTM, Joint Laboratory of Optics, 17. listopadu 12, 771 46 Olomouc, Czech Republic;2. Institute of Physics, Academy of Sciences of the Czech Republic, Na Slovance 2, 14800 Prague, Czech Republic;3. Department of Inorganic Technology, Institute of Chemical Technology Prague, Technicka 5, 16628 Prague, Czech Republic;4. Department of Electrical Engineering, University of Nebraska - Lincoln, Lincoln Nebraska 68588, USA;5. Department of Materials Science and Engineering, University of Erlangen-Nuremberg, Martensstrasse 7, D-91058 Erlangen, Germany |
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| Abstract: | Undoped and cobalt-doped zinc oxide (CZO) polycrystalline piezoelectric thin films (Co: 3, 5 at.%) using a series of high quality ceramic targets have been deposited at 450 °C onto glass substrates using a pulsed laser deposition method. The used source was a KrF excimer laser (248 nm, 25 ns, 2 J∕cm2). X-ray diffraction patterns showed that the Co-doped ZnO films crystallize in a hexagonal wurtzite type structure with a strong (0 orientation, and the grain sizes calculated from these patterns decrease from 37 to 31 nm by increasing Co doping. The optical waveguiding properties of the films were characterized by using a prism-coupling method. The distinct M-lines of the guided transverse magnetic (TM) and transverse electric (TE) modes of the ZnO films waveguide have been observed. With the aim of study the optical properties of the ZnO films, an accurate refractive index and thickness measurement apparatus was set up, which is called M-lines device. An evaluation of experimental uncertainty and calculation of the precision of the refractive index and thickness were developed on ZnO films. The optical transmittance spectra showed a good transparency in the visible region. Calculated optical band gap varying from 3.23 to 3.37 eV when the content of Co doping increases from 0 to 5 at.%. |
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| Keywords: | Thin films ZnO Pulsed laser deposition Piezoelectric Waveguiding properties Optical transmittance |
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