Characterization of an Electrically Controlled Metamaterial Terahertz Modulator Using Dynamic Measurement Method |
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| Authors: | Zhen Zhou YongLi Chen LiShuang Feng |
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| Affiliation: | 1.School of Instrumentation Science and Opto?Electronics Engineering,Beihang University,Beijing,China;2.Precision Opto-mechatronics Technology Key Laboratory of Education Ministry,Beihang University,Beijing,China;3.Key Laboratory on Inertial Science and Technology,Beihang University,Beijing,China |
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| Abstract: | The characterization results of a typical electrically controlled metamaterial terahertz (THz) modulator obtained by the dynamic measurement method are presented and are in good agreement with the theoretical results predicted by a first-order model. The dynamic measurement method can characterize the modulation depth and modulation speed simultaneously. The reliability of the method is verified by terahertz time-domain spectroscopy (THz-TDS), and the current response method, which show that the more intuitive and comprehensive dynamic measurement method, can be used to characterize the electrically controlled metamaterial THz modulator accurately. |
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