| 脉冲激光试验评估模拟电路单粒子效应 |
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| 引用本文： | 马英起,封国强,上官士鹏,陈 睿,朱 翔,韩建伟.脉冲激光试验评估模拟电路单粒子效应[J].太赫兹科学与电子信息学报,2012,10(5):633-638. |
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| 作者姓名： | 马英起 封国强 上官士鹏 陈 睿 朱 翔 韩建伟 |
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| 作者单位： | 中国科学院空间科学与应用研究中心 |
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| 基金项目： | 国家自然科学基金资助项目(40974113);中国科学院知识创新工程青年基金资助项目(O82111A17S) |
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| 摘 要： | 利用脉冲激光对典型模拟电路的单粒子效应进行了试验评估及加固技术试验验证,研究2种不同工艺的运算放大器的单粒子瞬态脉冲(SET)效应,在特定工作条件下两者SET脉冲特征规律及响应阈值分别为79.4 pJ和115.4 pJ,分析了SET脉冲产生和传播特征及对后续数字电路和电源模块系统电路的影响。针对SET效应对系统电路的危害性,设置了合理的滤波电路来完成系统电路级加固,并通过了相关故障注入试验验证,取得了较好的加固效果。
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| 关 键 词： | 模拟电路 脉冲激光 单粒子效应 单粒子瞬态脉冲 |
| 收稿时间： | 2012/4/23 0:00:00 |
| 修稿时间： | 2012/5/18 0:00:00 |
Pulsed laser test of single event effects in analog circuits |
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| MA Ying-qi,FENG Guo-qiang,SHANGGUAN Shi-peng,CHEN Rui,ZHU Xiang and HAN Jian-wei.Pulsed laser test of single event effects in analog circuits[J].Journal of Terahertz Science and Electronic Information Technology,2012,10(5):633-638. |
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| Authors: | MA Ying-qi FENG Guo-qiang SHANGGUAN Shi-peng CHEN Rui ZHU Xiang and HAN Jian-wei |
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| Affiliation: | (Center for Space Science and Applied Research,Chinese Academy of Sciences,Beijing 100190,China) |
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| Abstract: | Pulsed laser Tests of Single Event Effects in the typical analog circuits were proposed. The Single Event Transient(SET) test evaluation method characteristics and the response thresholds of operational amplifiers at 79.4 pJ and 115.4 pJ were investigated with the experimental simulation by pulsed laser test facility. The influence of SET on subsequent digital circuits and power supply module system were qualitatively analyzed. According to the hazard of SET effect on circuit system, reasonable filter circuits were completed. The system level hardening by the related fault injection experiments were established which had good radiation hardening effects. |
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