Amplitude and frequency modulation torsional resonance mode atomic force microscopy of a mineral surface |
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Authors: | Ayhan Yurtsever Alexander M GiglerRobert W Stark |
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Affiliation: | Department of Earth and Environmental Sciences and Center for NanoScience, Ludwig-Maximilians-Universität München, Theresienstr. 41, 80333 Munich, Germany |
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Abstract: | Scanning probe imaging in a shear force mode allows for the characterization of in-plane surface properties. In a standard AFM, shear force imaging can be realized by the torsional resonance mode. In order to investigate the imaging conditions on mineral surfaces, a torsional resonance mode atomic force microscope was operated in amplitude (AM) and frequency modulation (FM) feedback. Freshly cleaved chlorite was investigated, which showed brucite-like and talc-like surface areas. In constant amplitude FM mode, a slight variation in energy dissipation was observed between both surfaces. Amplitude and frequency vs. distance curves revealed that the tip was in repulsive contact with the specimen during imaging. |
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Keywords: | 68 37 Ps 07 05 Pj 87 14 Gg |
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