|
|||||
|
|
Effect of amorphous layers on the interpretation of restored exit waves |
|
| Authors: | S. Van Aert L.Y. Chang S. Bals A.I. Kirkland G. Van Tendeloo |
| Affiliation: | 1. Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium;2. Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, UK |
| Abstract: | |
| Keywords: | 02.70.Rr 07.05.Pj 07.78.+s |
| 本文献已被 ScienceDirect 等数据库收录！ | |