Nanostructure defects in Si3N4 |
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Affiliation: | 1. Laser and Photonics Laboratory, Department of Physics, Mizoram University, Aizawl, 796004, India;2. School of Energy Science and Engineering, Indian Institute of Technology Guwahati, Assam, 781039, India;1. School of Materials Science and Engineering, Nanyang Technological University, 639798, Singapore;2. Institute of Materials Research and Engineering, #08-03, 2 Fusionopolis Way, Agency for Science, Technology and Research, 138634, Singapore;3. Department of Materials Science and Engineering, National University of Singapore, 117575, Singapore;1. Materials Science and Engineering Program, University of California, San Diego 92093-0418, USA;2. Department of Nano and Chemical Engineering, University of California, San Diego 92093-0448, USA;3. Center for Memory and Recording Research, University of California, San Diego 92093-040, USA;4. Department of Mechanical and Aerospace Engineering, University of California, San Diego 92093-0411, USA;1. School of Materials Science and Chemical Engineering, Xi''an Technological University, Xi''an, Shaanxi, 710021, PR China;2. Department of Applied Physics, Northwestern Polytechnical University, Xi''an, 710072, PR China;3. Powder Metallurgy Research Institute, Central South University, Changsha, 410083, PR China;1. Department of Chemistry, Indian Institute of Technology Madra, Chennai 600036, India;2. Department of Metallurgical and Materials Engineering, Indian Institute of Technology Madras, Chennai 600036, India;3. Thermoelectric Materials and Devices Laboratory, Department of Physics, Indian Institute of Science, Bangalore 560012, India;4. Univ. Lille, CNRS, INRAE, Centrale Lille, UMR 8207 - UMET - Unité Matériaux et Transformations, F-59000 Lille, France;5. School of Materials Science and Engineering, Nanyang Technological University, Singapore;6. Indian Institute of Technology Hyderabad, Kandi 502284, India |
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Abstract: | Microstructure defect studies of Si3N4 have contributed much to the development of Si3N4 ceramics material. In this paper we present some results of nanostructure defects by using high-resolution electron microscopy (HREM), showing new structural phenomena at the atomic level. |
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