退火温度对6.5%Si极薄带织构及磁性能的影响

采用单辊甩带法制备了厚度为0.03 mm的6.5%Si极薄带,并在真空炉中进行了880 ℃和920 ℃的退火处理。利用XRD和EBSD研究了其在退火后的宏观和微观织构演变规律。结果表明:经单辊甩带制得的6.5%Si极薄带织构主要由{001}<100>立方织构、{110}<001> Goss织构和{112}<111>织构组成。随着退火温度的升高,λ纤维仍占主导地位,且晶粒尺寸逐渐增大。特别是在920 ℃退火时,{001}<120>和{001}<100>晶粒的尺寸优势逐渐增大,不利织构{111}<110>和{111}<112>逐渐减弱,且最终的磁感应强度B₅₀=1.644 T,铁损耗P_10/400=5.896 W/kg。

Effect of annealing temperature on texture and magnetic properties of 6.5%Si ultra-thin strip

A 6.5%Si ultra-thin strip with thickness of 0.03 mm was fabricated by using of melt-spinning method, and subsequently annealed at 880 ℃ and 920 ℃ in vacuum furnace, respectively. The evolution of macro and micro texture under different annealing temperatures was investigated by means of X-ray diffraction and EBSD test. The results show that the 6.5%Si ultra-thin strip can be characterized by {001}<100> Cube, {110}<001> Goss and {112}<111> texture. The λ-fiber remains the dominant and the grain size increases gradually with the increase of annealing temperature. Especially, when annealed at 920 ℃, the size dominance of {001}<120> and {001}<100> grains increases gradually, and the unfavorable texture {111}<110> and {111}<112> decrease. Meanwhile, preeminent magnetic inductions of 1.644 T(B₅₀) and iron losses of 5.896 W/kg(P_10/400) are achieved.