| 离子镀膜法制备铀薄膜的表征 |
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| 引用本文： | 于震,孙亮,张志忠,张生栋,张晓卫. 离子镀膜法制备铀薄膜的表征[J]. 核化学与放射化学, 2014, 36(5): 277-281. DOI: 10.7538/hhx.2014.36.05.0277 |
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| 作者姓名： | 于震 孙亮 张志忠 张生栋 张晓卫 |
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| 作者单位： | 1.核工业理化工程研究院，天津300180；2.中国原子能科学研究院 放射化学研究所，北京102413 |
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| 摘 要： | 研究了离子镀膜法制备铀薄膜的性质,可为改善薄膜性能、完善过程模型、优化制备参数和提高制备效率提供依据。本工作通过扫描电子显微镜和X射线衍射分别测量了离子镀膜法制备铀薄膜的表面形貌和物相结构,通过俄歇电子能谱和X射线光电子能谱结合Ar+溅射深度剖析,对离子镀膜法制备铀薄膜的元素成分、化学形态及纵深方向的分布进行了分析。分析结果表明:制备的铀薄膜在基体上分布连续,主要物相为CaF2类型面心结构UO2,主要形态为UO2、金属U和FeUO4化合物。
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| 关 键 词： | 铀膜 离子镀膜 形貌 结构 价态 组成 |
Characterization of Uranium Thin Film Prepared by Ion Plating |
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| YU Zhen,SUN Liang,ZHANG Zhi-zhong,ZHANG Sheng-dong,ZHANG Xiao-wei. Characterization of Uranium Thin Film Prepared by Ion Plating[J]. Journal of Nuclear and Radiochemistry, 2014, 36(5): 277-281. DOI: 10.7538/hhx.2014.36.05.0277 |
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| Authors: | YU Zhen SUN Liang ZHANG Zhi-zhong ZHANG Sheng-dong ZHANG Xiao-wei |
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| Affiliation: | 1.Research Institute of Physical and Chemical Engineering of Nuclear Industry, Tianjin 300180, China;2.China Institute of Atomic Energy, P. O. Box 275(26), Beijing 102413, China |
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| Abstract: | Uranium thin film prepared by ion plating was characterized on aspects of valances, components, morphology and compact texture, with X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results indicate that uranium thin film on the stainless steel matrix is continuous and consists of UO2, metal U and FeUO4. The analysis also reveals that the crystal structure of thin film is a face-centered cubic. |
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| Keywords: | uranium thin film ion plating morphology compact texture valances compo-nents |
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