应用非接触AFM鉴别表面下的原子种类

The noncontact atomic force microscope(NCAFM)using frequency modulation(FM)technique can resolve the atomic features of the various surfaces.Recently,we found that the NC-AFM has a capability to identify or recognize atom species on a sample surface,if we can control an atomic species at the tip apex.That is,we succeeded in identification of Si and Ge atoms by imaging the Si/Ge intermixing Si(111)Surface using Si tip,where both of Si and Ge atoms are group IV elements[1].In the present experiments,we further investigate the capability of NC-AFM to identify the atom species under the surface.

Identification of subsurface atom species using noncontact AFM