Analysis of device performance and thin-film properties of thermally damaged organic light-emitting diodes |
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| Affiliation: | 1. Division of Display and Semiconductor Physics, Display Convergence, College of Science and Technology, Korea University Sejong Campus, 2511 Sejong-ro, Sejong City, 30019, Republic of Korea;2. Department of Applied Physics, Korea University Sejong Campus, 2511 Sejong-ro, Sejong City, 30019, Republic of Korea;3. E-ICT–Culture-Sports Convergence Track, Korea University Sejong Campus, 2511 Sejong-ro, Sejong City, 30019, Republic of Korea;4. Department of Physics and Nanotechnology, SRM Institute of Science and Technology, Kattankulathur, 603203, India;5. Division of Physics and Semiconductor Science, Dongguk University, Seoul, 04620, Republic of Korea;6. Department of Chemistry, Kongju National University, 56 Gongjudaehak-ro, Gongju, Chungnam, 32588, Republic of Korea;7. Surface Materials Division, Korea Institute of Materials Science (KIMS), Changwon, 51508, Republic of Korea;1. School of Materials Science and Engineering, Shanghai University, 200444, Shanghai, China;2. Sino-European School of Technology, Shanghai University, 200444, Shanghai, China;3. School of Mechatronic Engineering and Automation, Shanghai University, 200444, Shanghai, China;4. Light, Nanomaterials, Nanotechnologies (L2n), CNRS ERL 7004, University of Technology of Troyes, F-10004, Troyes Cedex, France;5. CIMAP, Normandie Univ, ENSICAEN, UNICAEN, CEA, UMR CNRS 6252, 6 Boulevard Maréchal Juin, 14050, Caen Cedex 4, France;1. School of Material and Chemistry Engineering, Xuzhou University of Technology, Xuzhou, 221018, China;2. Key Laboratory for Organic Electronics and Information Displays, Institute of Adv Mater (IAM), Nanjing University of Posts & Telecommunications, Nanjing, 210023, China;1. Key Laboratory of Theoretical Organic Chemistry and Functional Molecule, Ministry of Education, College of Chemistry and Chemical Engineering, Hunan University of Science and Technology, Xiangtan, 411201, PR China;2. College of Chemistry, Key Lab of Environment-Friendly Chemistry and Application in Ministry of Education, Xiangtan University, Xiangtan, 411105, PR China;3. School of Materials Science and Engineering, Jiangsu Collaborative Innovation Center of Photovoltaic Science and Engineering, Changzhou University, Changzhou, 213164, PR China;1. Centre for Organic Photonics & Electronics, The School of Chemistry and Molecular Biosciences, The University of Queensland, Queensland, 4072, Australia;2. Physics Department, Murdoch University, Perth, Western Australia 6150, Australia;1. Jiangsu Province Hi-Tech Key Laboratory for Bio-Medical Research, Jiangsu Engineering Laboratory of Smart Carbon-Rich Materials and Device, School of Chemistry and Chemical Engineering, Southeast University, Nanjing, Jiangsu, 211189, China;2. School of Environmental and Chemical Engineering, Jiangsu Key Laboratory of Function Control Technology for Advanced Materials, Jiangsu Ocean University, Lianyungang, Jiangsu, 222005, China |
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| Abstract: | This paper reports the variation in the optical and geometrical properties of individual organic layers to be used for thermally damaged top-emission organic light-emitting diodes (TEOLEDs). The copper deposited on the back of TEOLEDs is employed as a thermal facilitator, and a certain thermal damage occurs to the organic layers and devices. The phosphorescent host material 4,4′-bis(N-carbazolyl)-1,1′-biphenyl (CBP) is rapidly damaged to a significant extent owing to the low glass transition temperature (Tg), which also changes its optical and geometrical surface properties. Although the optical properties of the hole transport layer, N,N′-di(1-naphthyl)-N,N′-diphenyl-(1,1′-biphenyl)-4,4′-diamine (NPB) were changed slightly, the surface morphology was changed significantly. Despite having a higher Tg, the exciton blocking layer, tris(4-carbazoyl-9-ylphenyl)amine (TCTA), shows notable variations in optical properties and surface morphology due to heat exposure. Surprisingly, the electroluminescence spectra and micro-cavity are affected by increasing temperature without any considerable changes in device performance. Hence, this study reveals that besides Tg, the surface morphologies and thicknesses of the organic layers are also important factors in the annealing process and play a vital role in causing thermal damage to TEOLEDs. |
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| Keywords: | Top emission organic light-emitting diodes (TEOLEDs) Micro-cavity effect Surface morphological degradation |
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