|
|||||
|
|
The interdependence between the collapse phenomenon and theavalanche breakdown in AlGaAs/GaAs power heterojunction bipolartransistors |
|
| Authors: | Liu W. |
| Affiliation: | Corp. Res. & Dev., Texas Instrum. Inc., Dallas, TX; |
| Abstract: | |
| Keywords: | |
|
||||||||||||||||||||
|
||||||||||||||||||||
|
||||||||||||||||||||
|
|
|
|
| 设为首页 | 免责声明 | 关于勤云 | 加入收藏 |
|
Copyright©北京勤云科技发展有限公司 京ICP备09084417号 |