ESR and capacitance monitoring of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier |
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| Affiliation: | 1. Department of Biological Functions Engineering, Kyushu Institute of Technology, 2-4, Hibikino, Wakamatsu-ku, Kitakyushu, Fukuoka 808-0196, Japan;2. Research Institute for Applied Mechanics, Kyushu University, 6-1 Kasuga-koen, Kasuga, Fukuoka 816-8580, Japan;1. Instituto de Informática, PPGC/PGMicro Universidade Federal do Rio Grande do Sul-UFRGS, Brazil;2. Departamento de Informática e Estatística, Universidade Federal de Santa Catarina-UFSC, Brazil;1. School of Engineering and Applied Sciences, National University of Mongolia, Ikh surguuliin gudamj 3, Ulaanbaatar, 14201, Mongolia;2. Kyushu Institute of Technology, 2-4 Hibikino, Wakamatsu-ku, Kitakyushu 808-0196, Japan;3. Green Electronics Research Institute, 1-8 Hibikino, Wakamatsu-ku, Kitakyushu 808-0135, Japan;1. KAI GmbH, Austria;2. Otto-von-Guericke-University Magdeburg, Germany;1. Delft University of Technology, Mekelweg 4, 2628, CD, Delft, the Netherlands;2. Pontifcal Catholic University of Rio Grande do Sul (PUCRS), Av. Ipiranga 6681, Porto Alegre, Brazil |
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| Abstract: | Condition monitoring plays an important role in estimating health condition of capacitors because the ageing of the capacitors is usually accompanied by an increase in equivalent series resistance (ESR) and a decrease in capacitance. Either capacitance or ESR cannot be a unique indicator of the lifetime of capacitors in some cases. This paper presents a condition monitoring method of a dc-link capacitor used in a three-phase PWM inverter with a front-end diode rectifier intended for motor drives. The monitoring method extracts both the ESR and capacitance of a capacitor under test from the actual ripple current and voltage without disconnecting the capacitor nor injecting an additional current. The monitoring method, therefore, can be implemented online. Experimental results verify that the monitoring method independently obtains the ESR and capacitance changes of the capacitor under test. This contributes to accurate lifetime estimation of dc-link capacitors. |
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