| 120V隔离开关接触失效物理分析 |
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| 引用本文： | 石颉,姚建林,张路,施海宁,涂丰盛.120V隔离开关接触失效物理分析[J].低压电器,2010(3):4-7,11. |
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| 作者姓名： | 石颉 姚建林 张路 施海宁 涂丰盛 |
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| 作者单位： | 苏州热工研究院有限公司,江苏,苏州,215004 |
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| 摘 要： | 应用智能型多功能AD/DA转换单元、电压跟随单元、取样单元及可调节档位的电压信号放大单元,通过USB接口与计算机进行数据交换,配合编程软件对一个失效的120V隔离开关进行了接触电阻的变化趋势分析。应用电子扫描显微镜以及X射线能谱分析等表面微观分析技术,观察隔离开关电接触表面的形貌,并分析微区成分,确定隔离开关接触系统失效的原因。
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| 关 键 词： | 隔离开关 失效分析 接触电阻 电子扫描显微镜 |
Physical Analysis on Contact Failure of 120 V Isolating Switch |
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| SHI Jie,YAO Jianlin,ZHANG Lu,SHI Haining,TU Fengsheng.Physical Analysis on Contact Failure of 120 V Isolating Switch[J].Low Voltage Apparatus,2010(3):4-7,11. |
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| Authors: | SHI Jie YAO Jianlin ZHANG Lu SHI Haining TU Fengsheng |
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| Affiliation: | Suzhou Nuclear Power Institution Co.;Ltd.;Suzhou 215004;China |
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| Abstract: | The contact resistance of 120 V isolating switch was tested by an equipment which was made up of intelligent multi-function AD/DA converter,voltage follower,sampling unit and voltage amplify selector,connected with computer by USB interface,cooperated with LabVIEW software.The scanning electron microscopy and energy dispersive analysis system of X-ray were used to inspect and analyse the contact of isolating switch.By observing the microcosmic appearance and analysing the component of contact,the failure ca... |
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| Keywords: | isolating switch failure analysis contact resistor scanning electron microscopy（SEM） |
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