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宽带行波管可靠性预计模型研究
引用本文:陈宁,吕东亚.宽带行波管可靠性预计模型研究[J].真空电子技术,2012(2):61-64.
作者姓名:陈宁  吕东亚
作者单位:北京真空电子技术研究所,北京,100015
摘    要:通过对批量生产的应用于电子对抗系统国产行波管的可靠性数据的收集、分析,得出其可靠性水平.依据收集到的可靠性数据,通过回归分析建立宽带行波管可靠性预计模型.比较所建立的宽带行波管预计模型与299C中行波管可靠性预计模型的基本故障.列举出宽带行波管主要故障模式,并初步分析其故障机理.

关 键 词:行波管  电子对抗  可靠性模型  平均故障间隔  故障模式

Reliability Evaluation Model for Broad Band TWT
CHEN Ning , LV Dong-ya.Reliability Evaluation Model for Broad Band TWT[J].Vacuum Electronics,2012(2):61-64.
Authors:CHEN Ning  LV Dong-ya
Affiliation:(Beijing Vacuum Electronics Research Institute,Beijing 100015,China)
Abstract:This paper summarizes the accomplishments on a program to collect,study,and analyze reliability data and to develop models that can be used to predict the reliability of broad band travelling-wave tube(TWT).The basic failure is compared between broad band TWT and 299C.Some main failure modes of broad band TWT is proposed and the failure mechanisms are discussed.
Keywords:TWT  Electronic counter measure systems  Reliability model  Mean time between failure  Failure mode
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