| 用于辐照效应实验的带微处理器电路的故障测试系统 |
| |
| 引用本文： | 毕增军,孙驰,范丽思. 用于辐照效应实验的带微处理器电路的故障测试系统[J]. 电测与仪表, 2003, 40(2): 31-33,46 |
| |
| 作者姓名： | 毕增军 孙驰 范丽思 |
| |
| 作者单位： | 军械工程学院静电与电磁防护研究所,石家庄,050003 |
| |
| 基金项目： | 国家自然科学基金项目资助50077024,(重点)50237040 |
| |
| 摘 要： | 研制了一个用于对带微处理器电路进行辐照效应实验的故障测试系统，它既能自动检测出电磁脉冲（EMP）对电路的干扰。也能检测出EMP对电路的硬损伤。文中分别给出了干扰级和损伤级效应结果的测试方法。并用高功率微波脉冲对系统中的受试电路单元进行辐照效应实验，结果表明本系统能够完成各项检测功能。这为研究带微处理器电路的电磁防护措施提供了有力工具。
|
| 关 键 词： | 电磁脉冲 辐照效应 带微处理器电路 故障测试 |
| 文章编号： | 1001-1390(2003)02-0031-03 |
A fault testing system of microprocessor-based circuit used for irradiation effect experiment |
| |
| X Bi Zengjun,Sun Ch i,Fan Lisi. A fault testing system of microprocessor-based circuit used for irradiation effect experiment[J]. Electrical Measurement & Instrumentation, 2003, 40(2): 31-33,46 |
| |
| Authors: | X Bi Zengjun Sun Ch i Fan Lisi |
| |
| Abstract: | In thi s paper,a fault testing system of microprocessor-based circuit used for ir-radi ation effect experiment is developed,which can not only test the interference but also the hardware damage to the circuit caused by electromagnetic pulse(EM P).Testing meth-ods of the results of irradiation effect at both the interfer ence level and the damage level are also given in the paper.Irradiation effect experiment of the circuit unit under test in the system is done by using high p ower microwave pulse and the results show that the system can accomplish every t est function,which can provide an efficient tool for the study of electromagne tic protection measures to microprocessor-based circuits. |
| |
| Keywords: | EMP irr adiation effect microprocessor-based circuit fault testing |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
