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基于GPIB接口的时钟测试仪内部晶振频率自动测试系统
引用本文:孙杰,韩海林,陈习权. 基于GPIB接口的时钟测试仪内部晶振频率自动测试系统[J]. 上海计量测试, 2012, 0(5): 8-9,16
作者姓名:孙杰  韩海林  陈习权
作者单位:/浙江省计量科学研究院
摘    要:介绍时钟测试仪,给出了基于GPIB接口的时钟测试仪内部晶振频率自动测试系统的硬件平台构建和自动测试实现方法,并详细讨论了实现过程中仪器控制、数据采集、数据处理和输出实现,最后给出了性能分析。

关 键 词:时钟测试仪  自动测试  内部晶振频率  通用接口总线

Clock tester internal oscillator frequency automatic test system based on GP1B interface
Sun Jie,Han Hailin,Chen Xiquan. Clock tester internal oscillator frequency automatic test system based on GP1B interface[J]. Shanghai Meassurement and Testing, 2012, 0(5): 8-9,16
Authors:Sun Jie  Han Hailin  Chen Xiquan
Affiliation:(Zhejiang institute of metrology, Hangzhou)
Abstract:Introduced a clock tester, gave the building of hardware platform and the achievement of automated testing for the clock tester internal oscillator frequency automatic test system based on GPIB interface, and discussed in detail instrument control, data acquisition, data processing and output to achieve in the implementation process, finally gave the performance analysis.
Keywords:clock tester  automatic test  Internal oscillator frequencyGeneral-Purpose Interface Bus
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