面阵探测器相连缺陷元识别定位

面阵探测器相连缺陷元的光电信号与正常元基本相同,因此采用现有面阵测试方法无法识别相连缺陷元.针对相连缺陷元的特点,提出了借助改变面阵探测器光电响应的方法来实现相连缺陷元的识别定位.实验结果表明,该方法使面阵探测器分为两个不同透过率探测单元,多元相连缺陷元响应电压是相对应的两个不同透过率探测单元响应电压之和的平均值.采用MATLAB软件对测试数据进行分析处理,分析结果清晰给出缺陷元诸如个数、形状和位置等详细信息.采用本方法面阵探测器相连缺陷元可以被显著识别定位.研究结果为今后的面阵探测器评测与可靠性提高提供了参考.

Identification and orientation of connected defective elements in FPA

As we know, it is difficult to identify connected defective elements by FPA test-bench because the response voltage of connected defective elements is basically the same as that of normal pixels. In this paper identification and orientation of connected defective elements in focal plane array (FPA) are presented. To characteristic of connected defective elements, we proposed a novel method which realizes the identification and orientation of connected defective elements by measuring the response voltage of detectors. Results show that the response voltage of detector can be divided into two sections by using the proposed method. The response voltage of connected defective elements is average of corresponding response voltage of the two sections units. The test data is analyzed by MATLAB software and the particular information of connected defective elements such as number, shape and location is shown. The connected defective elements are identified and orientated markedly by the technique. Our study presents a crucial step for testing and evaluating FPA.