Embedded totally self-checking checkers: a practical design |
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Authors: | Kundu S Reddy SM |
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Affiliation: | IBM Thomas J. Watson Res. Center, Yorktown Heights, NY; |
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Abstract: | In a totally self-checking (TSC) design, the circuit detects errors by monitoring redundantly coded data/control paths through a TSC checker. A problem arises when not all these code words are on the monitored lines during normal operation. A method of designing checkers that solves this difficulty is proposed. The method uses TSC checkers based on flip-flops instead of using the mostly combinational checkers now available. Two design applications are presented: TSC checkers for arithmetic AN codes, and a TSC iterative logic array |
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