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Optical micro-scanning location calibration of thermal microscope imaging system |
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| Authors: | GUAN Cong-rong GAO Mei-jing JIN Wei-qi and WANG Ji-hui |
| Affiliation: | 1. MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China; College of Mechanical and Electrical Engineering, North China University of Technology, Beijing 100041, China 2. Department of Information Science and Engineering, Yanshan University, Qinhuangdao, Hebei 066004, China 3. MoE Key Laboratory of Photoelectronic Imaging Technology and System, School of Optoelectronics, Beijing Institute of Technology, Beijing 100081, China |
| Abstract: | A method of micro-scanning location adaptive calibration was proposed, which was realized by the digital image micro-displacement estimation. With geometric calculation, this calibration method used the displacement estimation of two thermal microscope images to get the size and direction of each scanning location calibration angle. And each location calibration process was repeated according to the offset given by the system beforehand. The comparison experiments of sequence oversampling reconstruction before and after the micro-scanning location calibration were done. The results showed that the calibration method effectively improved the thermal microscope imaging quality. |
| Keywords: | thermal microscope imaging micro-scanning location calibration oversampling reconstruction |
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