Structural morphology of amorphous conducting carbon film |
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Authors: | P N Vishwakarma V Prasad S V Subramanyam V Ganesan |
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Affiliation: | (1) Department of Physics, Indian Institute of Science, 560 012 Bangalore, India;(2) Inter University Consortium for DAE Facilities, 452 017 Indore, India |
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Abstract: | Amorphous conducting carbon films deposited over quartz substrates were analysed using X-ray diffraction and AFM technique.
X-ray diffraction data reveal disorder and roughness in the plane of graphene sheet as compared to that of graphite. This
roughness increases with decrease in preparation temperature. The AFM data shows surface roughness of carbon films depending
on preparation temperatures. The surface roughness increases with decrease in preparation temperature. Also some nucleating
islands were seen on the samples prepared at 900°C, which are not present on the films prepared at 700°C. Detailed analysis
of these islands reveals distorted graphitic lattice arrangement. So we believe these islands to be nucleating graphitic.
Power spectrum density (PSD) analysis of the carbon surface indicates a transition from the nonlinear growth mode to linear
surface-diffusion dominated growth mode resulting in a relatively smoother surface as one moves from low preparation temperature
to high preparation temperature. The amorphous carbon films deposited over a rough quartz substrate reveal nucleating diamond
like structures. The density of these nucleating diamond like structures was found to be independent of substrate temperature
(700–900° C). |
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Keywords: | Carbon amorphous AFM FFT X-ray diffraction |
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