Acoustic emission for detecting deterioration of capacitors under aging

There is continuous pressure on production cost reduction of foil-based capacitors, widely used in domestic appliance. Therefore, investigation of the deterioration mechanisms within capacitors is important to reduce their production costs at maintained reliability. These mechanisms were observed in two capacitors batches of classes Y2 (27 nF) and X2 (470 nF). An acoustic emission signal was observed when the capacitors were polarized by excessive voltage. This signal is induced by partial discharges that can lead to capacitor destruction. Next, the capacitors were aged at elevated temperature and also in presence of excessive polarization. We conclude that the acoustic emission signal can predict deterioration of dielectric insulation resistance in capacitors of class Y2. The observed destruction of capacitor of class X2 is caused mainly by detachment of the sprayed metalized contacts that is induced by overheating during partial discharges sparking.