Thermal,optical, dielectric and electrical transport properties of nano-structured Se95-xIn5Prx (x = 2, 4, and 6) glassy alloys |
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| Affiliation: | 1. Physics Department, Faculty of Science, South Valley University, Qena, 83523, Egypt;2. Ferroelectric & Piezoelectric Lab, Faculty of Science, South Valley University, Qena, 83523, Egypt;3. Basic Science Department, Faculty of Engineering, Sinai University, Al-Arish, 45511, Egypt;1. School of Materials Science and Engineering, Chang’an University, Xi’an 710061, China;2. State Key Laboratory of Environment-Friendly Energy Materials, Southwest University of Science and Technology, Mianyang 621010, China;1. The Institute of Natural Sciences, College of Humanities and Sciences, Nihon University 3-25-40 Sakurajousui, Setagaya-ku, Tokyo, 156-8550, Japan;2. Department of Physics, College of Humanities and Sciences, Nihon University 3-25-40 Sakurajousui, Setagaya-ku, Tokyo, 156-8550, Japan;3. Department of Earth and Environmental Sciences, College of Humanities and Sciences, Nihon University 3-25-40 Sakurajousui, Setagaya-ku, Tokyo, 156-8550, Japan;4. Correlative Study of Physics and Chemistry, Graduate School of Integrated Basic Sciences, Nihon University 3-25-40 Sakurajousui, Setagaya-ku, Tokyo, 156-8550, Japan;5. Department of Chemistry, College of Humanities and Sciences, Nihon University 3-25-40 Sakurajousui, Setagaya-ku, Tokyo, 156-8550, Japan;1. School of Advanced Materials and Nanotechnology, Xidian University, Xi''an, 710126, China;2. Frontier Research Center of Thin Films and Coatings for Device Applications, Academy of Advanced Interdisciplinary Research, Xidian University, Xi''an, 710126, China;1. Afyon Kocatepe University, Faculty of Engineering, Department of Materials Science and Engineering, Afyonkarahisar, Turkey;2. Department of Physics, Faculty of Science, Ataturk University, 25240, Erzurum, Turkey;3. Department of Physics, College of Science, Princess Nourah Bint Abdulrahman University, P.O. Box 84428, Riyadh, 11671, Saudi Arabia;4. Department of Medical Diagnostic Imaging, College of Health Sciences, University of Sharjah, 27272, Sharjah, United Arab Emirates;5. Computer Engineering Department, Faculty of Engineering and Natural Sciences, Istinye University, Istanbul, 34396, Turkey |
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| Abstract: | In the present study, Se95-xIn5Prx (x = 2, 4, and 6) alloys were prepared using the melt quench technique. X-ray diffraction (XRD) and Raman spectroscopy reveal that the glassy matrix of each sample consists of crystalline entities identified as a mixed phase of indium selenide (HCP) and praseodymium selenide (FCC). TEM images show that the crystalline entities are nanorods stuck to nanoparticles. The thermal stability and optical band gap (direct) decrease (1.974 eV to 1.425 eV) with Pr content. The dielectric constant and loss are maximums for x = 4 at any frequency and temperature (30°C-60 °C). AC conductivity follows the correlated barrier hopping (CBH) model (frequency exponent and decreases with temperature) with non-intimate valence alteration pairs (NVPA) for x = 2 and 6, and intimate valence alteration pairs (IVPA) for x = 4. AC activation energy decreases with Pr concentration at all frequencies in the study range. |
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| Keywords: | Chalcogenide glasses XRD TEM Raman spectroscopy Thermal stability Dielectric properties |
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