首页 | 本学科首页   官方微博 | 高级检索  
     

压接型IGBT器件内部压力分布
引用本文:邓二平,赵志斌,张朋,黄永章,林仲康. 压接型IGBT器件内部压力分布[J]. 电工技术学报, 2017, 32(6)
作者姓名:邓二平  赵志斌  张朋  黄永章  林仲康
作者单位:1. 新能源电力系统国家重点实验室(华北电力大学) 北京 102206;国家电网全球能源互联网研究院 北京 102211;2. 新能源电力系统国家重点实验室(华北电力大学) 北京 102206;3. 国家电网全球能源互联网研究院 北京 102211
基金项目:国家自然科学基金项目,国家能源应用技术研究及工程示范项目,国家电网公司科技项目
摘    要:压接型IGBT器件内部各组件直接堆叠在一起,通过外部压力使得各组件间保持良好的机械与电气接触,进而引入一定比例的接触电阻和接触热阻,所以器件内部的压力分布不仅影响器件内部的电流分布和温度分布,还将严重影响器件的可靠性。基于压接型IGBT器件的有限元计算模型和特殊的应用工况,研究压接型IGBT器件内部的压力分布情况,重点探讨器件内部各组件加工误差与内部的布局方式对器件内部压力分布的影响。通过压力夹具和压力纸等进行压接型IGBT器件内部压力分布的实验,实验结果不仅验证了有限元模型和边界条件的正确性,还表明外部压力加载对器件内部压力分布的影响。

关 键 词:压接型IGBT器件  压力分布  可靠性  有限元计算模型  压力纸

Clamping Force Distribution within Press Pack IGBTs
Deng Erping,Zhao Zhibin,Zhang Peng,Huang Yongzhang,Lin Zhongkang. Clamping Force Distribution within Press Pack IGBTs[J]. Transactions of China Electrotechnical Society, 2017, 32(6)
Authors:Deng Erping  Zhao Zhibin  Zhang Peng  Huang Yongzhang  Lin Zhongkang
Abstract:External clamping force is needed to keep all components of press pack IGBTs (PP IGBTs) both electrical and mechanical contact well, which is directly stacked together. It will introduce electrical and thermal contact resistances. Thus, the clamping force is an important parameter for the chip, because it influences electrical contact resistance, thermal contact resistance and power cycling reliability. The clamping force distribution within PP IGBTs is analyzed based on the finite element model and specific application conditions. The impacts of machining tolerance and internal layout of PP IGBTs are discussed. The test bench, including clamping fixture and FUJI prescale, is used to measure the clamping force distribution within PP IGBTs. The experimental results agree well with those using the finite element model. It can not only verify the correct of finite element model and boundary conditions, but also indicate that the external clamping also has a huge influence on the clamping force distribution within PP IGBTs.
Keywords:Press pack IGBTs  clamping force distribution  reliability  finite element model  prescale
本文献已被 CNKI 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号