A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing |
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Authors: | Chen-Fu Chien Chia-Yu Hsu |
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Affiliation: | (1) Department of Industrial Engineering and Engineering Management, National Tsing Hua University, 101 Section 2 Kuang Fu Road, Hsinchu, 30013, Taiwan |
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Abstract: | Wafer fabrication for semiconductor manufacturing consists of multiple layers, in which the displacements (i.e., overlay errors)
between layers should be reduced to enhance the yield. Although it can reduce variance between layers by fixing the exposure
machine (i.e. steeper or scanner), it is not practical to expose the wafer on the same machine from layer to layer for the
lengthy fabrication process in real setting. Thus, there is a critical need to determine the similarity machine subgroups,
in which appreciate backups for unexpected machine down can be also prioritized. This study aims to develop a novel methodology
to fill this gap based on the proposed similarity measurement of systematic overlay errors and residuals. The proposed methodology
was validated via empirical study in a wafer fab and the results showed practical viability of this approach.
Received: May 2005 / Accepted: December 2005 |
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Keywords: | Overlay Similarity Machine Subgroups Modeling Semiconductor manufacturing |
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