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GaN肖特基核辐射探测器对X射线的响应时间特性研究
引用本文:付凯,于国浩,陆敏. GaN肖特基核辐射探测器对X射线的响应时间特性研究[J]. 原子能科学技术, 2010, 44(Z1): 449-452. DOI: 10.7538/yzk.2010.44.suppl.0449
作者姓名:付凯  于国浩  陆敏
作者单位:1. ;中国科学院 ;苏州纳米技术与纳米仿生研究所,江苏 ;苏州 ;215123;2. ;中国科学院 ;研究生院,北京 ;100049
基金项目:国家自然科学基金资助项目,江苏省自然科学基金资助项目,苏州市应用基础研究计划资助项目,国家重点基础研究发展计划资助项目 
摘    要:通过制作大面积GaN肖特基X射线探测器,研究了GaN肖特基探测器对X射线的时间响应特性。实验采用Fe掺杂的高阻自支撑GaN片来制备器件,对不同偏压下的时间响应进行了测试。针对所测得的实验结果,对其内部机理进行了分析,提出了1个GaN肖特基探测器对X射线照射下的时间响应的理论模型,得到非常好的拟合结果。实验发现,由于高阻层的存在,GaN肖特基探测器具有很高的信噪比,即使在可能的光淬灭效应的影响下,探测器在200V反向偏压下的信噪比仍可达到80左右。

关 键 词:GaN   肖特基探测器   X射线   响应时间

Time Response of GaN Schottky Detector for X-ray Detection
FU Kai,YU Guo-hao,LU Min. Time Response of GaN Schottky Detector for X-ray Detection[J]. Atomic Energy Science and Technology, 2010, 44(Z1): 449-452. DOI: 10.7538/yzk.2010.44.suppl.0449
Authors:FU Kai  YU Guo-hao  LU Min
Affiliation:1. Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Science, Suzhou 215123, China; 2. Graduate University of Chinese Academy of Sciences, Beijing 100049, China
Abstract:Time response of GaN Schottky detector with a large area to X-ray was studied. Using a Fe-doped GaN high resistive film to make the detector, the time response under different bias was tested. For the measured results, a theoretical model of time response of GaN Schottky detector to X-ray irradiation was proposed, and its internal mechanism was studied with a very good fitting results. It is found, due to the presence of high resistivity layer, the GaN Schottky detector can have a high signal to noise ratio of about 80 at reverse bias of 200 V, even in the possible effects of light quenching.
Keywords:GaN
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