A comparative study on the susceptibility of LiF:Mg,Ti (TLD-100) and LiF:Mg,Cu,P (TLD-100H) to spurious signals in thermoluminescence dosimetry

It is well known that spurious signals can occur in thermoluminescence dosimetry (TLD) whenever contaminants (i.e. dirt, oil, dust) are present on the surface of the TLD card or crystal during the read-out process. For TLD cards, the Teflon material can also contribute to the background noise and this contribution has been found to depend on the material's light absorption. These non-radiation-induced signals contribute to the total light output during TLD read-out and can lead to incorrect dosimetry especially for low-dose measurements such as personal dosimetry. However, these spurious signals are generally in the low-temperature channels and are mostly accompanied by abnormal glow curves. Most of the published reports dealing with this type of spurious TL signal are on the LiF:Mg,Ti (TLD-100) material. The relatively new TLD material, LiF:Mg,Cu,P, is more sensitive and has higher signal-to-noise ratio than the traditional LiF:Mg,Ti. In this study, the effects of disturbing signals to the LiF:Mg,Cu,P (TLD-100H) cards used in personal dosimetry are investigated and compared with those of LiF:Mg,Ti (TLD-100).