Reliability and performance enhancements for SSD RAID |
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| Affiliation: | 1. Computer Sciences Department, University of Jaén, Campus Las Lagunillas s/n, Jaén, 23071, Spain;2. School of Computing and Mathematics, University of Ulster, Jordanstown, BT37 0QB, U.K.;1. Convergence Laboratory, KT R&D Center, 151 Taebong-ro, Seocho-gu, Seoul 06763, Korea;2. Department of Computer Science and Engineering, Soongsil University, 369 Sangdo-Ro, Dongjak-gu, Seoul 156-743, Korea;3. Department of Computer Science and Engineering, Seoul National University of Science and Technology (SeoulTech), 232 Gongneung-ro, Nowon-gu, Seoul, 01811, Korea;1. College of Computer Science, Zhejiang University, Hangzhou, China;2. School of Information Technology, Deakin University, Burwood, Vic. 3125, Australia;3. Handal Indah Pte. Ltd., Singapore;1. Leeds Beckett University, UK;2. Providence University, Taiwan;3. Hubei University of Education, China;1. CEA, LIST, Laboratory of Model Driven Engineering for Embedded Systems, P.C. 174, Gif-sur-Yvette 91191, France;2. CEA, LIST, Software Reliability and Security Laboratory, P.C. 174, Gif-sur-Yvette 91191, France;3. Faculty of Computers and Information, Menofia University, Egypt |
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| Abstract: | NAND based solid state storage devices are almost ubiquitously used in safety-critical embedded devices, and recent advances have demonstrated RAID architectures specific to solid state storage devices resulting in increased data reliability, with architectural enhancements to solve the age convergence problem. However, these techniques require devices to be taken off-line while components are replaced—consequently these devices are of limited use in hard real time systems. There are further real time issues in that the conventional architectures ignore other characteristics of solid state devices such as garbage collection and meta data management. In this paper we investigate techniques that support the replacement of aged devices in the array in such a way that we provide continuous system reliability. We also improve the performance overhead of the reconstruction process using a novel data migration policy. The techniques are implemented and tested in a trace-driven simulator, and results demonstrate that average I/O response time is improved by up to 39% with improvement by up to 45% in its standard deviation, overheads in terms of device replacement time are negligible, and read performance is improved by an average of 8%. |
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