| 逐次截尾样本下电子元件混联系统可靠性指标的EB估计 |
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| 引用本文： | 师小琳. 逐次截尾样本下电子元件混联系统可靠性指标的EB估计[J]. 现代电子技术, 2008, 31(12): 1-4 |
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| 作者姓名： | 师小琳 |
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| 作者单位： | 西安邮电学院,陕西,西安,710121 |
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| 基金项目： | 国家自然科学基金 , 陕西省教育厅资助项目 |
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| 摘 要： | 在逐次截尾样本下,研究电子元件混联系统可靠性指标的估计问题。将Bayes方法和极大似然法相结合,在平方损失下,获得部件失效率、系统可靠度和平均寿命的经验Bayes估计。最后给出随机模拟例子,说明该方法的正确性。结果表明可靠性指标的经验Bayes估计值精度较高。
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| 关 键 词： | 混联系统 可靠性指标 逐次截尾样本 经验Bayes估计 |
| 文章编号： | 1004-373(2008)12-001-03 |
| 修稿时间： | 2007-10-08 |
EB Estimation of the Reliability Performance for Compound System with Electronic Components Based on Progressively Censored Sample |
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| SHI Xiaolin. EB Estimation of the Reliability Performance for Compound System with Electronic Components Based on Progressively Censored Sample[J]. Modern Electronic Technique, 2008, 31(12): 1-4 |
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| Authors: | SHI Xiaolin |
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| Abstract: | Based on progressively censored sample,the problems of estimating the reliability performance for compound system with electronic components are studied by using Bayes and MLE approaches.Under the squared loss,the formulae to calculate Empirical Bayes(EB) estimation of the failure rate,the reliability function and mean lifetime for the system are given.Finally,an illustrative numerical example is examined by means of the Monte-Carlo simulation.It is shown that the method proposed in this paper is correct.The results prove that empirical Bayes estimation of reliability performance has high precision. |
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| Keywords: | compound system reliability performance progressively censored sample empirical Bayes estimation |
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