Morphology of organic electronic materials imaged via electron tomography

Organic electronic materials and nanostructures have been studied with the use of electron tomography. Nanostructured materials including contrast enhancing features have been studied and double tilt data collection has been employed to improve reconstructions. Tomography reconstructions of active layers of organic solar cells, where various preparation techniques have been used, have been analysed and compared to device behaviour. Small changes in preparation procedures may lead to large differences in morphology and device performance, and the results also indicate a complex relation between these.