Simple equation for elastohydrodynamic film thickness under acceleration |
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Authors: | J. Sugimura T. Okumura Y. Yamamoto H. A. Spikes |
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Affiliation: | a Department of Energy and Mechanical Engineering, Kyushu University, Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan;b Tribology Section, Imperial College, Exhibition Road, London SW7 2BX, UK |
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Abstract: | A simple approximation of EHD film thickness under varying speed conditions is proposed. The equation is based on continuity of flow, by which the film formed at the contact inlet moves downstream within the contact with little subsequent change in its thickness even though the boundary velocities are changing. The approximation is supported by experimental results of non-steady state film thickness measurement using ultra-thin film interferometry. It is also shown by numerical simulation that the approximation holds for film thickness in the rigid piezoviscous regime under line contact so long as the squeeze film effect is insignificant. |
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Keywords: | Elastohydrodynamic Film thickness Transient |
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