微处理器系统功能测试

针对微处理器系统测试问题，提出了一种全新的功能测试方法。详细介绍了该方法的硬件组成和测试生成。该方法以结构故障模型为基础，将数字电路故障分为3大类6种故障，分另4为固定型故障、开路型故障和短路型故障3种，其中固定型故障又可分为固定0和固定1两种，开路故障分为开路为0、开路为1以及开路为Z三种。为了验证该方法的有效性，本文针对一块以MC6800为微处理器的电路板进行了测试程序开发。实验结果表明，故障覆盖率取得了满意的结果。

Functional Testing for Microprocessor Systems

We propose a new approach of functional testing for microprocessor systems and discuss the hardware associated and test generation.The approach is based on constructional fault model which divides the faults of digital circuits into three categories: stuck faults, open faults and short faults.Of that, stuck at one and stuck at zero belong to stuck faults and open at one, open at zero and open at Z to open faults.To verify the approach, we generate the test program for a circuit board based on MC6800 microprocessor.The results of experiments suggest a higher fault coverage is achieved.